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 SAMWIN
General Description Features
N-Channel MOSFET BVDSS (Minimum) RDS(ON) (Maximum) ID Qg (Typical) PD (@TC=25 ) : 200 V : 0.18 ohm : 18A : 40 nc : 139 W
SW640
This power MOSFET is produced in SAMWIN with advanced VDMOS process, planar stripe.This technology enable power MOSFET to have better characteristics, such as fast switching time, low on resistance, low gate charge and especially excellent avalanche characteristics. It is mainly suitable for half bridge or full bridge resonant topology like a electronic ballast, and also low power switching mode power appliances. D
G S
Absolute Maximum Ratings
Symbol
VDSS ID IDM VGS EAS EAR dv/dt PD TSTG,TJ TL Drain to Source Voltage Continuous Drain Current (@Tc=25 Continuous Drain Current (@Tc=100 Drain Current Pulsed Gate to Source Voltage Single Pulsed Avalanche Energy Repetitive Avalanche Energy Peak Diode Recovery dv/dt Total Power Dissipation (@Tc=25 Derating Factor above 25 Operating junction temperature &Storage temperature Maximum Lead Temperature for soldering purpose, 1/8 from Case for 5 seconds. ) (Note 2) (Note 1) (Note 3) ) ) (Note 1)
Parameter
Value
200 18 11.4 72 30 250 13.9 5.5 139 1.10 -55~+150 300
Units
V A A A V mJ mJ V/ns W W/
Thermal Characteristics
Value Symbol
R R R
JC
Units Max
0.9 0.5 62.5 /W /W /W
Parameter
Thermal Resistance, Junction-to-Case Thermal Resistance, Case-to-Sink Thermal Resistance, Junction-to-Ambient
Min
-
Typ
-
CS JA
1/6
REV0.2
05.6.9
SAMWIN
Electrical Characteristics
Symbol Off Characteristics
BVDSS BVDSS/ Tj Drain- Source Breakdown Voltage Breakdown Voltage Temperature coefficient VGS=0V,ID=250uA ID=250uA,referenced to 25 VDS=200V, VGS=0V IDSS Drain-Source Leakage Current Gate-Source Leakage Current IGSS Gate-Source Leakage Reverse VDS=160V, Tc=125 VGS=30V,VDS=0V VGS=-30V, VDS=0V 200 (Tc=25 unless otherwise noted)
SW640
Value Test Conditions Min Typ Max Units
Parameter
0.2
-
V V/
-
1 100 -100
uA nA nA
On Characteristics
VGS(th) RDS(ON) Gate Threshold Voltage Static Drain-Source On-state Resistance VDS=VGS,ID=250uA VGS=10V,ID=3.25A 2.0 0.15 4.0 0.18 V ohm
Dynamic Characteristics
Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance VGS=0V,VDS=25V, f=1MHz 1350 180 45 1750 240 60 pF
Dynamic Characteristics
td(on) tr td(off) tf Qg Qgs Qgd Turn-on Delay Time Rise Time Turn-off Delay Time Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge (Miller Charge) VDS=320V,VGS=10V, ID=6.5A (Note4,5) VDD=200V,ID=6.5A RG=50ohm (Note4,5) 25 80 150 70 40 6 21 50 230 300 200 55 nc n s
Source-Drain Diode Ratings and Characteristics
Symbol
IS ISM VSD trr Qrr
Parameter
Continuous Source Current Pulsed Source Current Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge
Test Conditions
Integral Reverse p-n Junction Diode in the MOSFET
Min.
-
Typ.
195 1.47
Max.
18 72 1.5 -
Unit.
A
IS=6.5A,VGS=0V IS=6.5A,VGS=0V, dIF/dt=100A/us
V ns uc
NOTES 1. Repeativity rating: pulse width limited by junction temperature 2. L=18.6mH,IAS=18A,VDD=50V,RG=0ohm, Starting TJ=25 3. ISD 18A,di/dt 100A/us,VDD BVDSS, Starting TJ=25 4. Pulse Test: Pulse Width 300us,Duty Cycle 2% 5. Essentially independent of operating temperature.
2/6
REV0.2
05.6.9
SAMWIN
VGS top:10V 9V 8V 7V 6V 5.5V 5V bottom:5.0V
SW640
25 C ID,Drain Current [A]
10
o
ID,Drain Current [A]
10
150 C
o
1
Note:
1
Note:
1.250us pulse test 2.TC=25oC
1.VDS=50V 2.250us pulse test.
0.1 0.1
0.1
1
10
2
4
6
8
10
VDS,Drain-to-Source voltage [V]
VGS, Gate-Source Voltage [V]
Fig 1. On-State Characteristics
1.0
Fig 2. Transfer Characteristics
Drain-Source On-Resistance[ohm]
0.8
IDR,Reverse Drain Current[A]
10
0.6
VGS=20V VGS=10V
RDS(ON)
150 C
1
o
25 C
o
0.4
0.2
Note:TJ=25 C
o
Note:
1.vGS=0v 2.250us test
0.0 0 10 20 30 40 50 60
0.1 0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
ID, Drain Current[A]
VSD,Source-Drain Voltage[V]
Fig 3. On Resistance Variation vs. Drain Current and Gate Voltage
4000 3750 3500 3250 3000 2750
Ciss = Cgs+Cgd(Cds=shorted) Coss= Cds+Cgd Crss = Cgd
Fig 4. On State Current vs. Allowable Case Temperature
12
10
VDS=160V VDS=100V
VGS,Gate-Source Voltage [V]
8
Capacitance [pF]
2500 2250 2000 1750 1500 1250 1000 750 500 250 0 0.1
Note:
VDS=40V
Ciss Coss Crss
6
4
2
1.VGS=0V 2.f=1MHz.
Note:ID=18A
0 0 10 20 30 40 50
1
10
VDS,Drain-Source Voltage [V]
QG,Total Gate Charge [nC]
Fig 5. Capacitance Characteristics (Non-Repetitve)
3/6
Fig 6. Gate Charge Characteristics
REV0.2
05.6.9
SAMWIN
1.2
3.0
SW640
2.5
Drain-Source Breakdown Voltage
Drain-Source On-Resistance
1.1
BVDSS[Normalized]
2.0
1.0
RDs(on)(Normalized)
Note:
1.5
1.0
0.9
Note:
0.5
1.VGS=0V 2.ID=250uA
0.8 -100 -50 0 50 100
o
1.VGS=10V 2.ID=9A
150
200
0.0 -100
-50
0
50
100
o
150
200
TJ,Junction Temperatur [ C]
TJ,Junction Temperature[ C]
Fig 7. Breakdown Voltage Variation vs. Junction Temperature
20
Fig 8. On-Resistance Variation vs. Junction Temperature
10
2
Operation In This Area Limted By RDS(ON)
16
ID, Drain Current[A]
10us
10
1
1ms 10ms
ID, Drain Current[A]
100us
12
8
10
0
10
-1
Note: 1.Tc=25C 2.Tj=150C 3.Single Pulse
0
4
10
10
1
10
2
0 25
50
75
100
o
125
150
VD,Drain-Source Voltage[V]
Tc,Case Temperature [ C]
Fig9. Maximum Safe Operating
Fig 10. Maximum Drain Current Vs. Case Temperature
1
D = 0 .5
(t),Thermal Response
0 .2 0 .1 0 .1 0 .0 5 0 .0 2
JC
0 .0 1 s in g le p u ls e
N o te :
Z
1 .Z
JC
(t)= 0 .9 C /w M a x
o
0 .0 1
2 .D u ty F a c to r ,D = t1 /t2 3 .T j- T c = P D M * Z J C ( t)
1 E -5
1 E -4
1 E -3
0 .0 1
0 .1
1
10
Fig 11. Transient Thermal Response Curve
t1 ,S q u a r e W a v e P u ls e D u r a tio n ( s e c )
4/6
REV0.2
05.6.9
SAMWIN
Same Type as DUT
300nF
SW640
VGS
10V
Qg Qgs Qgd
50K 200nF
VDS
VGS
DUT
1mA
Charge
Fig 12. Gate Charge test Circuit & Waveforms
RL VDS
VDD (0.5 rated VDS)
VDS
90%
10V
Pulse Generator
RG
DUT
Vin
10% tf
td(off)
td(on) tr ton
toff
Fig 13. Switching test Circuit & Waveforms
L VDS VDD BVDSS RG DUT 10V IAS VDD
1 BVDSS EAS= --- LLIAS2--------------2 BVDSS-VDD
ID(t)
VDS(t)
tp
Time
Fig 14. Unclamped Inductive Switching test Circuit & Waveforms
5/6
REV0.2
05.6.9


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